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Localization and characterization of simple defects in finite-sized photonic crystals

Author
GROBY, Jean-Philippe1 2 ; LESSELIER, Dominique2
[1] Centre de Mathématiques Appliquées, UMR7641 CNRS/École Polytechnique, Route de Saclay, Palaiseau 91128, France
[2] Département de Recherche en Électromagnétisme-Laboratoire des Signaux et Systèmes, UMR8506 (CNRS-Supélec-Univ Paris-Sud), Gif-sur-Yvette 91192, France
Source

Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2008, Vol 25, Num 1, pp 146-152, 7 p ; ref : 20 ref

ISSN
1084-7529
Scientific domain
Electronics; Optics
Publisher
Optical Society of America, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Algorithme Cristal photonique Diffusion multiple Fonction Green Localisation défaut Problème inverse Réseau diffraction Tomographie optique 4230W 4270Q
Keyword (en)
Algorithms Photonic crystals Multiple scattering Green function Fault location Inverse problems Diffraction gratings Optical tomography
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30W Image reconstruction; tomography

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B70 Optical materials / 001B40B70Q Photonic bandgap materials

Discipline
Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20036474

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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