An AFM, XPS and wettability study of the surface heterogeneity of PS/PMMA-r-PMAA demixed thin films
- Author
- ZUYDERHOFF, Emilienne M1 ; DEKEYSER, Caroline M1 ; ROUXHET, Paul G1 ; DUPONT-GILLAIN, Christine C1
[1] Unité de chimie des interfaces, Université catholique de Louvain, Croix du Sud 2/18, 1348 Louvain-la-Neuve, Belgium - Source
Journal of colloid and interface science. 2008, Vol 319, Num 1, pp 63-71, 9 p ; ref : 22 ref
- Publisher
- Elsevier, San Diego, CA
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- AFM Demixed film PMMA-r-PMAA PS Polymer blend Selective dissolution Wettability XPS
- Keyword (fr)
- Couche mince Dissolution Film Hétérogénéité Microscopie force atomique Mouillabilité Polymère Rayon X Spectrométrie photoélectron
- Keyword (en)
- Thin film Dissolution Film Heterogeneity Atomic force microscopy Wettability Polymer X ray Photoelectron spectrometry
- Keyword (es)
- Capa fina Disolución Película Heterogeneidad Microscopía fuerza atómica Remojabilidad Polímero Rayos X Espectrometría fotoelectrón
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01I Surface physical chemistry
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01J Colloidal state and disperse state
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20056769
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.jcis.2007.11.007 
https://dx.doi.org/10.1016/j.jcis.2007.11.007
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