The Determination and Indetermination of Service Times in Manufacturing Systems
- Author
- KAN WU1 ; KEUNG HUI
[1] School of Industrial and Systems Engineering, Georgia Institute of Technology, Atlanta, GA, United States - Source
IEEE transactions on semiconductor manufacturing. 2008, Vol 21, Num 1, pp 72-82, 11 p ; ref : 19 ref
- ISSN
- 0894-6507
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Cycle time effective process time queueing time service time takt time theoretical processing time utilization
- Keyword (fr)
- Approche déterministe Chaîne fabrication Fabrication circuit intégré File attente Intervalle temps Système attente Système événement discret Temps exécution Temps traitement
- Keyword (en)
- Deterministic approach Production line Integrated circuit manufacture Queue Time interval Queueing system Discrete event system Execution time Processing time
- Keyword (es)
- Enfoque determinista Línea fabricación Fila espera Intervalo tiempo Sistema fila espera Sistema acontecimiento discreto Tiempo ejecución Tiempo proceso
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20057187
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TSM.2007.914334 
https://dx.doi.org/10.1109/TSM.2007.914334
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