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Amplification of specular x-rays caused by grazing-angle incidence backscattering diffraction in epitaxial bi-layer grown on relaxed crystalline substrate

Author
BEZIRGANYAN, Hakob P1 ; BEZIRGANYAN, Siranush E2 ; BEZIRGANYAN, Petros H3 ; BEZIRGANYAN, Hayk H4
[1] Department of Solid State Physics, Yerevan State University, 1 Alex Manoogian Street, Yerevan City, 0025, Armenia
[2] Department of Medical and Biological Physics, Yerevan State Medical University after Mkhitar Heratsi, 2 Koryuni Street, Yerevan City, 0025, Armenia
[3] Department of Computer Science, State Engineering University of Armenia, 105 Terian Street, Yerevan City, 0009, Armenia
[4] Department of Informatics and Applied Mathematics, Yerevan State University, 1 Alex Manoogian Street, Yerevan City, 0025, Armenia
Source

Journal of optics. A, Pure and applied optics (Print). 2008, Vol 10, Num 2 ; 025002.1-025002.9 ; ref : 33 ref

ISSN
1464-4258
Scientific domain
Optics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
Mathieu functions backscattering diffraction epitaxial bi-layer grazing-angle incidence x-ray specular beam amplification stacking fault surfaces and interfaces theory
Keyword (fr)
Amplification optique Diffraction RX Déformation mécanique Germanium Hétérojonction Incidence rasante Miroir Méthode non destructive Rayon X Réflexion spéculaire Rétrodiffusion Silicium 0785 6110 8170E Ge Si Substrat Silicium
Keyword (en)
Optical amplification XRD Strains Germanium Heterojunctions Grazing incidence Mirrors Non destructive method X radiation Specular reflection Backscattering Silicon
Keyword (es)
Amplificación óptica Incidencia rasante Método no destructivo Reflexión especular
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A70 Materials testing

Discipline
Metrology Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20121605

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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