Amplification of specular x-rays caused by grazing-angle incidence backscattering diffraction in epitaxial bi-layer grown on relaxed crystalline substrate
- Author
- BEZIRGANYAN, Hakob P1 ; BEZIRGANYAN, Siranush E2 ; BEZIRGANYAN, Petros H3 ; BEZIRGANYAN, Hayk H4
[1] Department of Solid State Physics, Yerevan State University, 1 Alex Manoogian Street, Yerevan City, 0025, Armenia
[2] Department of Medical and Biological Physics, Yerevan State Medical University after Mkhitar Heratsi, 2 Koryuni Street, Yerevan City, 0025, Armenia
[3] Department of Computer Science, State Engineering University of Armenia, 105 Terian Street, Yerevan City, 0009, Armenia
[4] Department of Informatics and Applied Mathematics, Yerevan State University, 1 Alex Manoogian Street, Yerevan City, 0025, Armenia - Source
Journal of optics. A, Pure and applied optics (Print). 2008, Vol 10, Num 2 ; 025002.1-025002.9 ; ref : 33 ref
- Publisher
- Institute of Physics, Bristol
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- Mathieu functions backscattering diffraction epitaxial bi-layer grazing-angle incidence x-ray specular beam amplification stacking fault surfaces and interfaces theory
- Keyword (fr)
- Amplification optique Diffraction RX Déformation mécanique Germanium Hétérojonction Incidence rasante Miroir Méthode non destructive Rayon X Réflexion spéculaire Rétrodiffusion Silicium 0785 6110 8170E Ge Si Substrat Silicium
- Keyword (en)
- Optical amplification XRD Strains Germanium Heterojunctions Grazing incidence Mirrors Non destructive method X radiation Specular reflection Backscattering Silicon
- Keyword (es)
- Amplificación óptica Incidencia rasante Método no destructivo Reflexión especular
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A70 Materials testing
- Discipline
- Metrology Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20121605
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/1464-4258/10/2/025002 
https://dx.doi.org/10.1088/1464-4258/10/2/025002
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