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MUSIC imaging applied to total internal reflection tomography

Author
XUDONG CHEN1
[1] Department of Electrical and Computer Engineering, National University of Singapore, Singapore, 117576, Singapore
Source

Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2008, Vol 25, Num 2, pp 357-364, 8 p ; ref : 24 ref

ISSN
1084-7529
Scientific domain
Electronics; Optics
Publisher
Optical Society of America, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Angle incidence Bruit Classification image Diffusion inverse Diffusion multiple Image tridimensionnelle Imagerie Microscopie optique Polarisation optique Réflexion interne totale Tomographie 4225F 4230 Sub longueur onde
Keyword (en)
Incidence angle Noise Image classification Inverse scattering Multiple scattering Tridimensional image Imagery Optical microscopy Optical polarization Total internal reflection Tomography Subwavelength
Keyword (es)
Difusión inversa Imagen tridimensional Imaginería Reflexión interna total
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing

Discipline
Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20145204

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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