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Influence of losses on the superresolution performances of an impedance-matched negative-index material

Author
D'AGUANNO, Giuseppe1 ; MATTIUCCI, Nadia1 ; BLOEMER, Mark J1
[1] Charles M. Bowden Research Center, Research, Development, and Engineering Command, Building 7804, Redstone Arsenal, Alabama 35898-5000, United States
Source

Journal of the Optical Society of America. B, Optical physics (Print). 2008, Vol 25, Num 2, pp 236-246, 11 p ; ref : 31 ref

CODEN
JOBPDE
ISSN
0740-3224
Scientific domain
Optics
Publisher
Optical Society of America, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Diffraction onde électromagnétique Etude théorique Indice réfraction négatif Matériau optique Microscopie champ proche Métamatériau Superrésolution Vecteur Poynting 4225F 4270
Keyword (en)
Electromagnetic wave diffraction Theoretical study Negative refraction index Optical materials Scanning probe microscopy Metamaterial Superresolution Poynting vector
Keyword (es)
Metamaterial Superresolución Vector Poynting
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B70 Optical materials

Discipline
Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20145405

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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