Simultaneous capture and shift power reduction test pattern generator for scan testing
- Author
- LIN, H.-T1 ; LI, J. C.-M1
[1] Laboratory of Dependable Systems (LaDS), Graduate Institute of Electronics Engineering, National Taiwan University, Taiwan, Province of China - Source
IET computers & digital techniques (Print). 2008, Vol 2, Num 2, pp 132-141, 10 p ; ref : 21 ref
- ISSN
- 1751-8601
- Scientific domain
- Electronics; Computer science; Telecommunications
- Publisher
- Institution of Engineering and Technology, Stevenage
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Compactage Contrôlabilité Electronique faible puissance Energie pointe Essai dynamique Génération automatique test Génération vecteur test Traitement donnée
- Keyword (en)
- Compaction Controllability Low-power electronics Peak power Dynamic test Automatic test generation Test pattern generation Data processing
- Keyword (es)
- Compactación Controlabilidad Energía punta Ensayo dinámico Generación automatica prueba Generación vector prueba Tratamiento datos
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B07 Memory organisation. Data processing / 001D02B07B Data processing. List processing. Character string processing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D04 Telecommunications and information theory / 001D04A Information, signal and communications theory / 001D04A03 Information theory
- Discipline
- Computer science : theoretical automation and systems Telecommunications and information theory
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20185652
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1049/iet-cdt:20070088 
https://dx.doi.org/10.1049/iet-cdt:20070088
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