An Augmented Small-Signal HBT Model With Its Analytical Based Parameter Extraction Technique
- Author
- DEGACHI, Louay1 ; GHANNOUCHI, Fadhel M2
[1] PolyGrames Research Center, Electrical Engineering Department, Ecole Polytechnique de Montréal, Montréal, QC H3C 3A7, Canada
[2] Intelligent RF Radio Technology Laboratory, Electrical and Computer Engineering Department, Schulich School of Engineering, University of Calgary, Calgary, AB T2N 1N4, Canada - Source
I.E.E.E. transactions on electron devices. 2008, Vol 55, Num 4, pp 968-972, 5 p ; ref : 14 ref
- CODEN
- IETDAI
- ISSN
- 0018-9383
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- -AC emitter current crowding heterojunction bipolar transistor (HBT) parameter extraction small-signal equivalent-circuit model
- Keyword (fr)
- Capacité électrique Extraction paramètre Jonction collecteur base Régime signal faible Résistance étalement Schéma équivalent Shunt Transistor bipolaire hétérojonction
- Keyword (en)
- Capacitance Parameter extraction Base collector junction Small signal behavior Spreading resistance Equivalent circuit Shunt Heterojunction bipolar transistors
- Keyword (es)
- Capacitancia Extracción parámetro Unión colector base Régimen señal débil Resistencia ensanchamiento Esquema equivalente Shunt
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20214687
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/TED.2008.917539 
https://dx.doi.org/10.1109/TED.2008.917539
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