Etude par microscopie en champ proche et diffraction d'électrons rapides des premiers stades de croissance de systèmes métalliques. Application aux systèmes Fe/Fe(100), Cu/Fe(100) et Fe/Fe(100)
- Other title
- Scanning Tunneling Microscopy and Reflection High-Energy Electron Diffraction studies of the initial growth of metallic systems. Applications to Fe/Fe(100), Cu/Fe(100) et Fe/Fe(100) (en)
- Author
- Dulot, Frederic; Malterre, Daniel (Advisor (for a thesis or dissertation))
Université de Nancy 1, Nancy, France (Degree-grantor) - Source
Etude par microscopie en champ proche et diffraction d'électrons rapides des premiers stades de croissance de systèmes métalliques. Application aux systèmes Fe/Fe(100), Cu/Fe(100) et Fe/Fe(100). 2000, 184 p., ref : 230 ref
- Thesis number
- 00 NAN1 0073
- Document type
- Thesis (New Ph.D. thesis)
- Language
- French
- Keyword (fr)
- Analyse surface Croissance cristalline Diffraction électron Diffusion Epitaxie Microscopie tunnel optique Méthode étude
- Keyword (en)
- Surface analysis Crystal growth Electron diffraction Scattering Epitaxy Photon scanning tunneling microscopy Investigation method
- Keyword (es)
- Método estudio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy
- Discipline
- Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 202436
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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