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Sidelobe reduction of tightly focused radially higher-order Laguerre-Gaussian beams using annular masks

Author
OHTAKE, Yoshiyuki1 ; ANDO, Taro1 ; INOUE, Takashi1 ; MATSUMOTO, Naoya1 ; TOYODA, Haruyoshi1
[1] Hamamatsu Photonics K.K., Central Research Laboratory, Hirakuchi, Hamakita-Ku, Hamamatsu 434-8601, Japan
Source

Optics letters. 2008, Vol 33, Num 6, pp 617-619, 3 p ; ref : 14 ref

CODEN
OPLEDP
ISSN
0146-9592
Scientific domain
Electronics; Optics; Telecommunications
Publisher
Optical Society of America, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Faisceau laser Focalisation optique Formation image Interférence onde électromagnétique Mise en forme faisceau Ouverture optique 4230V 4260J Faisceau Laguerre Gauss
Keyword (en)
Laser beams Optical focusing Imaging Electromagnetic wave interference Beam shaping Aperture Laguerre Gaussian beams
Keyword (es)
Puesta forma haz Abertura óptica
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B60 Laser optical systems: design and operation / 001B40B60J Beam characteristics: profile, intensity, and power; spatial pattern formation

Discipline
Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20276472

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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