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In-situ spectroscopic ellipsometry : optimization of monitoring and closed-loop-control procedures

Author
HUMLICEK, J1
[1] Department of Condensed Matter Physics, Faculty of Science, Masaryk University, Kotlářská 2, 61137 Brno, Czech Republic
Conference name
International Conference on Spectroscopic Ellipsometry (ICSE 4) (ICSE 4) (4 ; Stockholm 2007-06-11)
Source

Physica status solidi. A, Applications and materials science (Print). 2008, Vol 205, Num 4, pp 793-796, 4 p ; ref : 8 ref

ISSN
1862-6300
Scientific domain
Crystallography; Electronics; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley-VCH, Berlin
Publication country
Germany
Document type
Conference Paper
Language
English
Keyword (fr)
Carbone adamantin Couche mince Ellipsométrie spectroscopique Facteur réflexion Optimisation Traitement donnée
Keyword (en)
Diamond-like carbon Thin films Spectroscopic ellipsometry Reflectivity Optimization Data processing
Keyword (es)
Elipsometría espectroscópica
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20278246

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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