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Test data compression for system-on-a-chip using extended frequency-directed run-length code

Author
EL-MALEH, A. H1
[1] Department of Computer Engineering, King Fahd University of Petroleum and Minerals, PO Box 1063, Dhahran 31261, Saudi Arabia
Source

IET computers & digital techniques (Print). 2008, Vol 2, Num 3, pp 155-163, 9 p ; ref : 37 ref

ISSN
1751-8601
Scientific domain
Electronics; Computer science; Telecommunications
Publisher
Institution of Engineering and Technology, Stevenage
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Circuit intégré Codage Compression donnée Evaluation performance Système sur puce
Keyword (en)
Integrated circuit Coding Data compression Performance evaluation System on a chip
Keyword (es)
Circuito integrado Codificación Compresión dato Evaluación prestación Sistema sobre pastilla
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20297861

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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