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Refraction and diffraction by a metal-dielectric multilayered structure

Author
KAMEDA, Shinji1 ; OHTA, Yasutomo2 ; KIKUTA, Hisao1
[1] School of Engineering, Osaka Prefecture University, 1-1 Gakuen-cho, Naka-ku, Sakai, Osaka, Japan
[2] School of Engineering, Tokyo University, 4-6-1 Komaba, Meguro-ku, Tokyo, Japan
Source

Journal of the Optical Society of America. A, Optics, image science, and vision (Print). 2008, Vol 25, Num 4, pp 903-910, 8 p ; ref : 11 ref

ISSN
1084-7529
Scientific domain
Electronics; Optics
Publisher
Optical Society of America, Washington, DC
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Diffraction onde électromagnétique Distribution intensité Etude théorique Indice réfraction Matériau diélectrique Mode TM Multicouche Métal Prisme Propagation onde électromagnétique Réfraction onde électromagnétique Simulation numérique 4225F 4225G
Keyword (en)
Electromagnetic wave diffraction Intensity distribution Theoretical study Refractive index Dielectric materials TM mode Multilayers Metals Prisms Electromagnetic wave propagation Electromagnetic wave refraction Digital simulation
Keyword (es)
Modo TM
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25G Edge and boundary effects; reflection and refraction

Discipline
Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20317844

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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