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Morphology effect on the electrochromic and electrochemical performances of NiO thin films

Author
XIA, X. H1 ; TU, J. P1 ; ZHANG, J1 ; WANG, X. L1 ; ZHANG, W. K2 ; HUANG, H2
[1] Department of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, China
[2] College of Chemical Engineering and Materials Science, Zhejiang University of Technology, Hangzhou 310032, China
Source

Electrochimica acta. 2008, Vol 53, Num 18, pp 5721-5724, 4 p ; ref : 29 ref

CODEN
ELCAAV
ISSN
0013-4686
Scientific domain
General chemistry, physical chemistry; Metallurgy, welding
Publisher
Elsevier, Oxford
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
NiO thin film;Morphology;Electrochromic;Chemical bath deposition;Sol-gel
Keyword (fr)
Caractéristique électrique Couche mince Diffraction RX Dépôt bain chimique Effet structure Electrochromisme Electrode ITO Microscopie électronique balayage Morphologie Nickel Oxyde Procédé sol gel Spectrométrie impédance électrochimique Structure surface
Keyword (en)
Electrical characteristic Thin film X ray diffraction Chemical bath deposition Structure effect Electrochromism Indium tin oxide electrode Scanning electron microscopy Morphology Nickel Oxides Sol gel process Electrochemical impedance spectroscopy Surface structure
Keyword (es)
Característica eléctrica Capa fina Difracción RX Depósito baño químico Efecto estructura Electrocromismo Electrodo ITO Microscopía electrónica barrido Morfología Niquel Óxido Procedimiento sol gel Estructura superficie
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01H Electrochemistry / 001C01H08 Miscellaneous (electroosmosis, electrophoresis, electrochromism, electrocrystallization, ...)

Discipline
General chemistry and physical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20351141

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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