Fretting wear behavior of nanocrystalline surface layer of copper under dry condition
- Author
- ZHANG, Y. S1 ; HAN, Z1 ; LU, K1
[1] Shenyang National Loboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, 72 Wenhua Road, Shenyang 110016, China - Source
Wear. 2008, Vol 265, Num 3-4, pp 396-401, 6 p ; ref : 17 ref
- CODEN
- WEARAH
- ISSN
- 0043-1648
- Scientific domain
- Chemical engineering; Mechanical engineering; Mechanics acoustics; Metallurgy, welding
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Author keyword
- Copper Fretting Nanocrystalline metals Surface mechanical attrition treatment (SMAT) Unlubricated friction
- Keyword (fr)
- Attrition Charge critique Couche oxyde Couche superficielle Cuivre Etude expérimentale Frottement sec Grenaillage Microdéplacement Résistance usure Surface contact Traitement surface Tribologie Usure petit débattement
- Keyword (en)
- Attrition Critical load Oxide layer Surface layer Copper Experimental study Dry friction Shot peening Microdisplacement Wear resistance Contact surface Surface treatment Tribology Fretting wear
- Keyword (es)
- Atrición Carga crítica Capa óxido Capa superficial Cobre Estudio experimental Frotamiento seco Granalla Microdesplazamiento Resistencia al desgaste Superficie contacto Tratamiento superficie Tribología Desgate pequinio desplazamiento
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D12 Mechanical engineering. Machine design / 001D12D Machine components / 001D12D02 Friction, wear, lubrication
- Discipline
- Mechanical engineering. Mechanical construction. Handling
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20354514
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.wear.2007.11.004 
https://dx.doi.org/10.1016/j.wear.2007.11.004
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