A spectroscopic ellipsometric investigation of new critical points of Zn1¯xMnxS epilayers
- Author
- KIM, D.-J1 ; LEE, J.-W2 ; YU, Y.-M3 ; CHOI, Y. D4
[1] Institute of Science & Technology, Mokwon University, Daejeon 302-729, Korea, Republic of
[2] Department of Materials Engineering, Hanbat National University, Daejeon 305-719, Korea, Republic of
[3] Process Reengineering Team, National Archives and Records Service, Daejeon 302-701, Korea, Republic of
[4] Department of Optical & Electronic Physics, Mokwon University, Daejeon 302-729, Korea, Republic of - Source
Applied surface science. 2008, Vol 254, Num 16, pp 5034-5038, 5 p ; ref : 30 ref
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- 78.20.-e 78.40.Fy Critical points Spectroscopic ellipsometry Zn1¯xMnxS epilayer
- Keyword (fr)
- Composé ternaire Diffraction RX Effet concentration Ellipsométrie spectroscopique Epitaxie Méthode paroi chaude Point critique Profil raie Semiconducteur Structure blende Sulfure de manganèse Sulfure de zinc Mn S Zn Zn1-xMnxS Composé minéral
- Keyword (en)
- Ternary compounds XRD Quantity ratio Spectroscopic ellipsometry Epitaxy Hot wall growth Critical points Line shape Semiconductor materials Blende structure Manganese sulfide Zinc sulfide Inorganic compounds
- Keyword (es)
- Elipsometría espectroscópica Método pared caliente Estructura blenda Manganeso sulfuro Zinc sulfuro
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering / 001B60A10N Single-crystal and powder diffraction
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H20 Optical properties of bulk materials and thin films / 001B70H20C Optical constants: refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy
- Pacs
- 7820C Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20365475
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.apsusc.2008.01.153 
https://dx.doi.org/10.1016/j.apsusc.2008.01.153
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