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A pressurized blister test model for the interface adhesion of dissimilar elastic-plastic materials

Author
JIANG, L. M1 2 ; ZHOU, Y. C1 2 ; LIAO, Y. G1 2 ; SUN, C. Q1 3
[1] Key Laboratory of Low Dimensional Materials and Application Technology of Ministry of Education, Xiangtan University, Hunan 411105, China
[2] Faculty of Materials, Optoelectronics and Physics, Xiangtan University, Hunan 411105, China
[3] School of Electrical and Electronic Engineering, Nanyang Technological University, 639798, Singapore
Source

Materials science & engineering. A, Structural materials : properties, microstructure and processing. 2008, Vol 487, Num 1-2, pp 228-234, 7 p ; ref : 16 ref

ISSN
0921-5093
Scientific domain
Crystallography; Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Author keyword
Blister test Cohesive element Elastic-plastic material Interface adhesion energy Quality of interface adhesion
Keyword (fr)
Adhérence Cloquage Couche mince Effet non linéaire Effet pression Elastoplasticité Energie interface Extrémité fissure Interface Matériaux dissemblables Modélisation Méthode élément fini Rupture
Keyword (en)
Adhesion Blisters Thin films Non linear effect Pressure effects Elastoplasticity Interface energy Crack tip Interfaces Dissimilar materials Modelling Finite element method Ruptures
Keyword (es)
Efecto no lineal Energía interfase Extremidad fisura Materiales desemejantes
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic / 001B60H60B Mechanical and acoustical properties

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20378797

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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