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Learning from Mistakes : A Comprehensive Study on Real World Concurrency Bug Characteristics

Autor
SHAN LU1 ; PARK, Soyeon1 ; SEO, Eunsoo1 ; YUANYUAN ZHOU1
[1] Department of Computer Science, University of Illinois at Urbana Champaign, Urbana, IL 61801, United States
Titulo de la conferencia
Proceedings of the Thirteenth International Conference on Architectural Support for Programming Languages and Operating Systems (ASPLOS XIII)
Nombre de la conferencia
ASPLOS XIII. International Conference on Architectural Support for Programming Languages and Operating Systems (13 ; Seattle, Washington 2008-03-01)
Autor ( monografía)
SIGARCH, United States (Organiser of meeting)
SIGPLAN, United States (Organiser of meeting)
SIGOPS, United States (Organiser of meeting)
Fuente

ACM SIGPLAN notices. 2008, Vol 43, Num 3, pp 329-339, 11 p ; ref : 43 ref

ISSN
1523-2867
Campo Científico
Computer science
Editor
ACM, Broadway, NY
País de la publicación
United States
Tipo de documento
Conference Paper
Idioma
English
Palabra clave de autor
Languages Reliability; concurrent program bug characteristics concurrency bug
Palabra clave (fr)
Accès mémoire Application client serveur Débogage Ecriture programme Essai programme Fiabilité Guidage Ingénierie simultanée Intention Interblocage Langage programmation Logiciel libre Modélisation Preuve programme Programme concurrent Simultanéité informatique Synchronisation Transformation programme
Palabra clave (in)
Storage access Client server application Debugging Program writing Program testing Reliability Guidance Concurrent engineering Intention Deadlock Programming language Open source software Modeling Program proof Concurrent program Concurrency Synchronization Program transformation
Palabra clave (es)
Acceso memoria Aplicación cliente servidor Puesta a punto programa Escritura programa Fiabilidad Guiado Ingeniería simultánea Intencíon Interbloqueo Lenguaje programación Software libre Modelización Prueba programa Programa competidor Simultaneidad informatica Sincronización Transformación programa
Clasificación
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B02 Programming languages

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B07 Memory organisation. Data processing / 001D02B07C Memory and file management (including protection and security)

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D02 Computer science; control theory; systems / 001D02B Software / 001D02B11 Computer aided design

Disciplina
Computer science : theoretical automation and systems
Procedencia
Inist-CNRS
Base de datos
PASCAL
Identificador INIST
20381250

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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