Modelling of pixel sensors for image systems with VHDL-AMS
- Author
- DADOUCHE, F1 ; PINNA, A1 ; GARDA, P1 ; ALEXANDRE-GAUTHIER, A1
[1] University Pierre & Marie Curie -Paris 6, SYEL -EA 2385 -BC 252; 4, place Jussieu, 75252 Paris, France - Conference title
- International Conference on Design & Test of Integrated Systems in Nanoscale Technology
- Conference name
- International Conference on Design & Test of Integrated Systems in Nanoscale Technology (Tunis 2006-09)
- Author (monograph)
- MASMOUDI, Mohamed (Editor)1 ; RENOVELL, Michel (Editor); GIRARD, Patrick (Editor)
[1] Laboratory of Micro-Electro Thermal Systems (METS), Tunisia - Source
International journal of electronics. 2008, Vol 95, Num 3, pp 211-225, 15 p ; ref : 1 p.1/4
- ISSN
- 0020-7217
- Scientific domain
- Electronics; Telecommunications
- Publisher
- Taylor & Francis, London
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Amplificateur opérationnel Capteur mesure Circuit intégré Circuit à signal mixte Composant électronique Dispositif optoélectronique Détecteur image Implémentation Intégration au niveau système Langage VHDL Langage description Modélisation Photodétecteur Pixel intelligent Système sur puce Technologie MOS complémentaire 0707D
- Keyword (en)
- Operational amplifier Measurement sensor Integrated circuit Mixed signal circuit Electronic component Optoelectronic device Image sensor Implementation System level integration VHDL language Description language Modeling Photodetector Smart pixels System on a chip Complementary MOS technology
- Keyword (es)
- Amplificador operacional Captador medida Circuito integrado Circuito de señal mixto Componente electrónico Dispositivo optoelectrónico Detector imagen Implementación Integración a nivel de sistema Lenguaje VHDL Lenguaje descripción Modelización Fotodetector Sistema sobre pastilla Tecnología MOS complementario
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F15 Optoelectronic devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F16 Imaging devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A2 Amplifiers
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20389333
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/00207210701827871 
https://dx.doi.org/10.1080/00207210701827871
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