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Influence of gap states on the electrical stability of pentacene thin film transistors

Author
BENOR, A1 ; KNIPP, D1 ; NORTHRUP, J2 ; VÖLKEL, A. R2 ; STREET, R. A2
[1] Jacobs University Bremen, School of Engineering and Science, Electronic Devices and Nanophotonics Laboratory, 28759 Bremen, Germany
[2] Palo Alto Research Center, Electronic Materials and Devices Laboratory, Palo Alto, CA 94304, United States
Conference title
Amorphous and Nanocrystalline Semiconductors - Science and Technology. Proceedings of the Twenty Second International Conference on Amorphous and Nanocrystalline Semiconductors
Conference name
International Conference on Amorphous and Nanocrystalline Semiconductors (ICANS 22) (ICANS 22) (22 ; Breckenridge, CO 2007-08-19)
Source

Journal of non-crystalline solids. 2008, Vol 354, Num 19-25, pp 2875-2878, 4 p ; ref : 15 ref

CODEN
JNCSBJ
ISSN
0022-3093
Scientific domain
Crystallography; Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Author keyword
73.50.Gr; 85.30.Tv; 71.20.-b; 73.50.-h; 72.80.Le Thin film transistors; Band structures; Defects
Keyword (fr)
Bande interdite Bande valence Centre accepteur Couche mince Densité état électron Défaut Effet contrainte Etat défaut Mobilité porteur charge Pentacène Polycristal Semiconducteur III-V Structure bande Tension seuil Transistor GaP
Keyword (en)
Energy gap Valence bands Acceptor center Thin films Electronic density of states Defects Stress effects Defect states Carrier mobility Pentacene Polycrystals III-V semiconductors Band structure Threshold voltage Transistors
Keyword (es)
Centro aceptor
Classification
Pascal
001 Exact sciences and technology / 001B Physics

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors

Discipline
Electronics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20405124

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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