AFM tip-induced ripple pattern on AIII-BV semiconductor surfaces
- Author
- SUCH, B1 ; KROK, F1 ; SZYMONSKI, M1
[1] Research Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Faculty of Physics, Astronomy and Applied Computer Science, Jagiellonian University, Reymonta 4, 30-059 Krakow, Poland - Source
Applied surface science. 2008, Vol 254, Num 17, pp 5431-5434, 4 p ; ref : 25 ref
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- AFM;Wear;InSb;62.20.Qp;68.37.Ps;81.40.Pq
- Keyword (fr)
- Antimoniure d'indium Formation nanomotif Interaction pointe surface Microscopie force atomique Ondulation Pointe microscope Semiconducteur Structure surface Terrasse In Sb InSb Composé minéral
- Keyword (en)
- Indium antimonides Nanopatterning Tip surface interactions Atomic force microscopy Ripples Microscope tips Semiconductor materials Surface structure Terrace Inorganic compounds
- Keyword (es)
- Formacíon nanomotivo Terraza
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy / 001B60A16C Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A16 Methods of nanofabrication / 001B80A16R Nanoscale pattern formation
- Discipline
- Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20429637
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.apsusc.2008.02.067 
https://dx.doi.org/10.1016/j.apsusc.2008.02.067
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