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A novel method for fault diagnosis of analog circuits based on WP and GPNN

Author
TAN YANGHONG1 ; HE YIGANG1
[1] College of Electric & Information Engineering, Hunan University, Changsha, China
Source

International journal of electronics. 2008, Vol 95, Num 4-6, pp 431-439, 9 p ; ref : 3/4 p

ISSN
0020-7217
Scientific domain
Electronics; Telecommunications
Publisher
Taylor & Francis, London
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Algorithme génétique Algorithme évolutionniste Approche probabiliste Circuit analogique Détection défaut Extraction caractéristique Réseau neuronal
Keyword (en)
Genetic algorithm Evolutionary algorithm Probabilistic approach Analog circuit Defect detection Feature extraction Neural network
Keyword (es)
Algoritmo genético Algoritmo evoluciónista Enfoque probabilista Circuito analógico Detección imperfección Red neuronal
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A8 Analog circuits

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G03 Neural networks

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20435595

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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