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Modification and application of an emission microscope for continuous wavelength spectroscopy

Author
RASRAS, M1 ; DE WOLF, I1 ; GROESENEKEN, G1 ; MAES, H. E1
[1] IMEC, Kapeldreef 75, 3001 Leuven, Belgium
Conference title
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97)
Conference name
European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97) (ESREF 97) (8 ; Arcachon 1997-10-07)
Author (monograph)
LABAT, Nathalie (Editor)1 ; TOUBOUL, André (Editor)1
[1] Laboratoire IXL, URA 846-CNRS - Université Bordeaux 1, 351 Cours de la Libération, 33405 Talence, France
Source

Microelectronics and reliability. 1997, Vol 37, Num 10-11, pp 1595-1598 ; ref : 4 ref

CODEN
MCRLAS
ISSN
0026-2714
Scientific domain
Electronics
Publisher
Elsevier, Oxford
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2047522

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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