Modification and application of an emission microscope for continuous wavelength spectroscopy
- Author
- RASRAS, M1 ; DE WOLF, I1 ; GROESENEKEN, G1 ; MAES, H. E1
[1] IMEC, Kapeldreef 75, 3001 Leuven, Belgium - Conference title
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97)
- Conference name
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 97) (ESREF 97) (8 ; Arcachon 1997-10-07)
- Author (monograph)
- LABAT, Nathalie (Editor)1 ; TOUBOUL, André (Editor)1
[1] Laboratoire IXL, URA 846-CNRS - Université Bordeaux 1, 351 Cours de la Libération, 33405 Talence, France - Source
Microelectronics and reliability. 1997, Vol 37, Num 10-11, pp 1595-1598 ; ref : 4 ref
- CODEN
- MCRLAS
- ISSN
- 0026-2714
- Scientific domain
- Electronics
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2047522
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0026-2714(97)00118-2 
https://dx.doi.org/10.1016/S0026-2714(97)00118-2
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