A simulation study of new multi-objective composite dispatching rules, CONWIP, and push lot release in semiconductor fabrication
- Author
- BAHAJI, N1 ; KUHL, M. E2
[1] Daifuku America Corporation, 7408 W. Detroit Street, Chandler, AZ 85226, United States
[2] Department of Industrial and Systems Engineering, Rochester Institute of Technology, Rochester, NY 14623, United States - Source
International journal of production research. 2008, Vol 46, Num 14, pp 3801-3824, 24 p ; ref : 2 p
- CODEN
- IJPRB8
- ISSN
- 0020-7543
- Scientific domain
- Control theory, operational research
- Publisher
- Taylor & Francis, London
/
Taylor & Francis, Washington, DC
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- Dispatching rules Scheduling Semiconductor manufacturing Simulation
- Keyword (fr)
- Analyse statistique Circuit à la demande Date échéance Encours (de fabrication) Fabrication microélectronique Modélisation Ordonnancement Pastille électronique Problème livraison Production masse Programmation multiobjectif Système paramètre variable
- Keyword (en)
- Statistical analysis Custom circuit Due date In-process inventory Microelectronic fabrication Modeling Scheduling Wafer Dispatching problem Mass production Multiobjective programming Time varying system
- Keyword (es)
- Análisis estadístico Circuito integrato personalizado Fecha vencimiento Depósito en-curso Fabricación microeléctrica Modelización Reglamento Pastilla electrónica Problema reparto Producción en masa Programación multiobjetivo Sistema parámetro variable
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20483294
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/00207540600711879 
https://dx.doi.org/10.1080/00207540600711879
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