The confocal Raman AFM : A powerful tool for the characterization of surface coatings
- Author
- SCHMIDT, U1 ; IBACH, W1 ; MUELLER, J1 ; HOLLRICHER, O1
[1] WITec GmbH, Hoervelsingerweg 6, 89081 Ulm, Germany - Conference title
- Optical measurement systems for industrial inspection V (18-22 June 2007, Munich, Germany)
- Conference name
- Optical measurement systems for industrial inspection. Conference (5 ; Munich 2007)
- Author (monograph)
- Osten, Wolfgang (Editor); Gorecki, Christophe (Editor); Novak, Erik (Editor)
Society of photo-optical instrumentation engineers Europe (Organiser of meeting)
European optical society (Organiser of meeting)
Wissenschaftliche Gesellschaft Lasertechnik, Germany (Organiser of meeting)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2007 ; 2Vol, pp 66160E.1-66160E.6 ; ref : 14 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-6758-4
- Scientific domain
- Electronics; Metrology and instrumentation; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Application industrielle Microscopie confocale Microscopie force atomique Multicouche Méthode mesure Méthode optique Résolution spatiale Spectrométrie Raman 0130C 0760P 0779L
- Keyword (en)
- Industrial application Confocal microscopy Atomic force microscopy Multilayers Measuring methods Optical method Spatial resolution Raman spectroscopy
- Keyword (es)
- Aplicación industrial Microscopía confocal Método óptico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60P Conventional optical microscopes
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques / 001B00G79L Atomic force microscopes
- Discipline
- Metrology Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20507740
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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