Monitoring thickness deviations in planar multi-layer elastic structures using impedance signatures (L)
- Author
- FISHER, Karl A1
[1] Lawrence Livermore National Laboratory, L-333, 7000 East Avenue, Livermore, California 94566, United States - Source
The Journal of the Acoustical Society of America. 2008, Vol 124, Num 1, pp 32-35, 4 p ; ref : 10 ref
- CODEN
- JASMAN
- ISSN
- 0001-4966
- Scientific domain
- Mechanics acoustics; Physiology, morphology
- Publisher
- Acoustical Society of America, Woodbury, NY
/
American Institute of Physics, Woodbury, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Acoustique structurale Impédance acoustique Matériau stratifié Mesure épaisseur
- Keyword (en)
- Structural acoustics Acoustic impedance Stratified material Thickness measurement
- Keyword (es)
- Ruido transmitido estructura Impedancia acústica Material estratificado Medición espesor
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40C Acoustics / 001B40C40 Structural acoustics and vibration
- Discipline
- Physics : acoustics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20525786
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1121/1.2770542 
https://dx.doi.org/10.1121/1.2770542
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