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Improved cutback method measuring beat-length for high-birefringence optical fiber by fitting data of photoelectric signal

Autor
SHI, Zhi-Dong1 ; LIN, Jian-Qiang2 ; BAO, Huan-Huan1 ; LIU, Shu1 ; XIANG, Xue-Nong1
[1] Key Lab of Special Fiber Optics, Shanghai University, Shanghai, 201800, China
[2] Guangxi Institute of Technology, Liuzhou, 545006, China
Titulo de la conferencia
International Symposium on Photoelectronic Detection and Imaging 2007 (Laser, ultraviolet, and terahertz technology : 9-12 September 2007, Beijing China)
Nombre de la conferencia
International Symposium on Photoelectronic Detection and Imaging (Beijing 2007)
Autor ( monografía)
Zhou, Liwei (Editor)
Zhongguo bing gong xue hui, China (Organiser of meeting)
Beijing li gong da xue, China (Organiser of meeting)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting)
North Night Vision Technology Company, China (Organiser of meeting)
Fuente

Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 662216.1-662216.9 ; ref : 13 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-6764-5
Campo Científico
Electronics; Optics; Physics
Editor
SPIE, Bellingham, Wash
País de la publicación
United States
Tipo de documento
Conference Paper
Idioma
English
Palabra clave (fr)
Biréfringence Etude expérimentale Fibre optique Lame onde Méthode mesure Méthode optique Photodiode Polarimètre Système mesure Traitement donnée 0130C 0760F 4281G
Palabra clave (in)
Birefringence Experimental study Optical fibers Wave plate Measuring methods Optical method Photodiodes Polarimeters Measurement systems Data processing
Palabra clave (es)
Placa onda Método óptico
Clasificación
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60F Polarimeters and ellipsometers

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B81 Fiber optics / 001B40B81G Birefringence, polarization

Disciplina
Metrology Physics : optics Theoretical physics
Procedencia
Inist-CNRS
Base de datos
PASCAL
Identificador INIST
20546487

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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