Multi-Frame Infrared Image Restoration
- Author
- SI TIAN1 2 ; JIANLIANG QIAO1 2 ; YOUTANG GAO1 2 ; YAFENG QIU2 ; BENKANG CHANG2
[1] Group of 442, Institute of Electronic Engineering and Optical Technology, NanJing University of science and Technology, NanJing 210094, China
[2] Department of electronic and electrician engineering,NanYang Institute of Technology, NanYang 473004, China - Conference title
- International Symposium on Photoelectronic Detection and Imaging 2007 (Related technologies and applications : 9-12 September 2007, Beijing China)
- Conference name
- International Symposium on Photoelectronic Detection and Imaging (Beijing 2007)
- Author (monograph)
- Zhou, Liwei (Editor)
Zhongguo bing gong xue hui, Topical Commitee of Optics, China (Organiser of meeting)
Beijing li gong da xue, School of Information and Technology, China (Organiser of meeting)
Optical Technique, Editorial Office (Organiser of meeting)
Zhongguo bing gong xue hui, China (Organiser of meeting)
Beijing li gong da xue, China (Organiser of meeting)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting)
North Night Vision Technology Company, China (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2008, pp 66250Q.1-66250Q.7 ; ref : 1 p
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-6767-6
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Aberration optique Dégradation Détecteur IR Détecteur rayonnement Echantillonnage Faisabilité Image floue Imagerie thermique Imagerie Instabilité Photodétecteur Restauration image Sous échantillonnage Traitement image 0130C 0757K 4215F 4230V 8560G
- Keyword (en)
- Optical aberration Degradation Infrared detectors Radiation detectors Sampling Feasibility Blurred image Thermal imaging Imagery Instability Photodetectors Image restoration Subsampling Image processing
- Keyword (es)
- Aberración óptica Muestreo Practicabilidad Imagen borrosa Imaginería Submuestreo
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G57 Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques / 001B00G57K Bolometer; infrared, submillimeter wave, microwave and radiowave receivers and detectors
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B15 Geometrical optics / 001B40B15F Aberrations
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D04 Telecommunications and information theory / 001D04A Information, signal and communications theory / 001D04A04 Signal and communications theory / 001D04A04C Sampling, quantization
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D04 Telecommunications and information theory / 001D04A Information, signal and communications theory / 001D04A05 Signal processing / 001D04A05C Image processing
- Discipline
- Metrology Physics : optics Telecommunications and information theory
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20546532
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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