Steady-state sinusoidal thermal characterization at chip level by internal infrared-laser deflection
- Author
- PERPINA, Xavier1 ; JORDA, Xavier1 ; VELLVEHI, Miquel1 ; ALTET, Josep2 ; MESTRES, Narcis3
[1] Centre Nacional de Microelectrônica (IMB-CNM-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain
[2] Departament d'Enginyeria Electrônica, Universitat Politècnica de Catalunya, Barcelona 08034, Spain
[3] Institut de Ciència dels Materials de Barcelona (ICMAB-CSIC), Campus UAB, 08193 Bellaterra, Barcelona, Spain - Source
Journal of physics. D, Applied physics (Print). 2008, Vol 41, Num 15 ; 155508.1-155508.7 ; ref : 20 ref
- CODEN
- JPAPBE
- ISSN
- 0022-3727
- Scientific domain
- Condensed state physics; Physics; Plasma physics
- Publisher
- Institute of Physics, Bristol
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse dommage Caractéristique thermique Circuit intégré Comportement thermique Composant électronique Condition aux limites Diffusivité thermique Essai thermique Evaluation performance Flux chaleur Laser IR Matrice formage Mesure température Méthode domaine fréquence Profil vertical Robustesse Réduction bruit Régime permanent Réponse fréquence
- Keyword (en)
- Failure analysis Thermal characteristic Integrated circuit Thermal behavior Electronic component Boundary condition Thermal diffusivity Thermal test Performance evaluation Heat flux Infrared laser Die Temperature measurement Frequency domain method Vertical profile Robustness Noise reduction Steady state Frequency response
- Keyword (es)
- Análisis avería Característica térmica Circuito integrado Comportamiento térmico Componente electrónico Condiciones límites Difusibilidad térmica Prueba térmica Evaluación prestación Laser IR Matriz formadora Medida temperatura Método dominio frecuencia Perfil vertical Robustez Reducción ruido Régimen permanente Respuesta frecuencia
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20546910
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1088/0022-3727/41/15/155508 
https://dx.doi.org/10.1088/0022-3727/41/15/155508
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