Influence of substrate temperature on the morphology and thermal resistance of vanadium oxide thin films
- Author
- XIONGBANG WEI1 ; ZHIMING WU1 ; TAO WANG1 ; XIANGDONG XU1 ; JINGIING TANG1 ; YADONG JIANG1
[1] School of Optoelectronic Information, State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China (UESTC), Chengdu, 610054, China - Conference title
- Sixth International Conference on Thin Film Physics and Applications (25-28 September 2007, Shanghai, China)
- Conference name
- International Conference on Thin Film Physics and Applications (6 ; Shanghai 2007)
- Author (monograph)
- Shen, Wenzhong (Editor); Chu, Junhao (Editor)
Shanghai jiao tong da xue, Department of Physics, China (Organiser of meeting)
Society of photo-optical instrumentation engineers, China (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2008 ; 1Vol, pp 69842K.1-69842K.4 ; ref : 19 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-7182-6
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Couche mince Cycle hystérésis Dépendance température Effet température Hystérésis thermique Matériau antiferromagnétique Microscopie force atomique Microstructure Oxyde de vanadium Propriété électrique 0130C 0779L 6855J 68 7350
- Keyword (en)
- Thin films Hysteresis loop Temperature dependence Temperature effects Thermal hysteresis Antiferromagnetic materials Atomic force microscopy Microstructure Vanadium oxide Electrical properties
- Keyword (es)
- Ciclo histéresis Histéresis térmica Vanadio óxido
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques / 001B00G79L Atomic force microscopes
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Discipline
- Metrology Physics of condensed state : structure, mechanical and thermal properties Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20566389
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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