Displacement damage in irradiated metals and semiconductors
- Author
- AVERBACK, R. S1 ; DIAZ DE LA RUBIA, T2
[1] Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
[2] Chemistry and Materials Science Directorate, Lawrence Livermore National Laboratory, Livermore, California, United States - Source
Solid state physics (New York. 1955). 1997, Vol 51, pp 281-402
- ISSN
- 0081-1947
- Scientific domain
- Condensed state physics
- Publisher
- Academic Press, San Diego, CA
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Calcul dynamique moléculaire Diffusion mutuelle Diffusion(transport) Défaut irradiation Effet physique rayonnement Effet recul Endommagement Faisceau ion Interaction particule surface Interaction électron phonon Modèle phénoménologique Mouvement défaut cristallin Mélange ionique Ordre désordre Paire Frenkel Pointe thermique Recuit Structure défaut Théorie cascade
- Keyword (en)
- Molecular dynamics calculations Interdiffusion Diffusion Irradiation defect Physical radiation effects Recoil effect Damage Ion beams Particule-surface interactions Electron-phonon interactions Phenomenological model Crystal defect motion Ion beam mixing Order disorder Frenkel defects Thermal spikes Annealing Defect structure Cascade theory
- Keyword (es)
- Difusión mútua Defecto irradiación Efecto retroceso Modelo fenomenológico Movimiento defecto cristalino Orden desorden
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A80 Physical radiation effects, radiation damage / 001B60A80J Ion radiation effects
- Discipline
- Metals. Metallurgy Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2059720
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0081-1947(08)60193-9 
https://dx.doi.org/10.1016/S0081-1947(08)60193-9
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