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A simple analytical model to accurately predict self-resonance frequencies of on-silicon-chip inductors in TEM mode and eddy current mode

Author
GUO, Jyh-Chyurn1 ; TAN, Teng-Yang1
[1] Department of Electronics Engineering National Chiao-Tung University No. 1001. Ta-Hsueh Road, Hsinchu 300, Taiwan, Province of China
Source

Solid-state electronics. 2008, Vol 52, Num 8, pp 1225-1231, 7 p ; ref : 16 ref

ISSN
0038-1101
Scientific domain
Electronics
Publisher
Elsevier Science, Oxford
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
Eddy current mode Inductor Self-resonance frequency Substrate resistivity TEM mode
Keyword (fr)
Bobine inductance Capacité parasite Conception circuit intégré Conception circuit Courant Foucault Fréquence résonance Inductance Large bande Mode TEM Mode courant Méthode analytique Silicium Si Sr
Keyword (en)
Inductor Spurious capacity Integrated circuit design Circuit design Eddy current Resonance frequency Inductance Wide band TEM mode Current mode Analytical method Silicon
Keyword (es)
Bobina inductancia Capacidad parásita Diseño circuito Corriente Foucault Frecuencia resonancia Inductancia Banda ancha Modo Onda Electromagnética Transversal Modo corriente Método analítico Silicio
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F10 Magnetic devices

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20605034

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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