Temperature dependence of electrical parameters of SMD ferrite components for EMI suppression
- Author
- STOJANOVIC, Goran1 ; DAMNJANOVIC, Mirjana1 ; ZIVANOV, Ljiljana1
[1] Faculty of Technical Sciences, University of Novi Sad, T. D. Obradovica 6, 21000 Novi Sad, Serbia - Source
Microelectronics and reliability. 2008, Vol 48, Num 7, pp 1027-1032, 6 p ; ref : 14 ref
- CODEN
- MCRLAS
- ISSN
- 0026-2714
- Scientific domain
- Electronics
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Assemblage circuit intégré Brouillage Caractéristique électrique Circuit intégré monolithique Dépendance fréquence Dépendance température Effet température Evaluation performance Ferrites Impédance Inductance Montage surface composant Multicouche Perturbation électromagnétique Régime fonctionnement
- Keyword (en)
- Integrated circuit bonding Electromagnetic interference Electrical characteristic Monolithic integrated circuit Frequency dependence Temperature dependence Temperature effect Performance evaluation Ferrites Impedance Inductance Surface mount technology Multiple layer Electromagnetic disturbance Operating rate
- Keyword (es)
- Interferencia Característica eléctrica Circuito integrado monolítico Efecto temperatura Evaluación prestación Ferritas Impedancia Inductancia Montaje superficie componente Capa múltiple Perturbación electromagnética Régimen funcionamiento
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20608222
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.microrel.2008.03.020 
https://dx.doi.org/10.1016/j.microrel.2008.03.020
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