Improved sectioning in a slit scanning confocal microscope
- Author
- POHER, Vincent1 ; KENNEDY, Gordon T1 ; MANNING, Hugh B1 2 ; OWEN, Dylan M1 2 ; ZHANG, Haoxiang X3 ; ERDAN GU3 ; DAWSON, Martin D3 ; FRENCH, Paul M. W1 ; NEIL, Mark A. A1
[1] Photonics Group, Blackett Laboratory, Imperial College London, London SW7 2AZ, United Kingdom
[2] Chemical Biology Centre, Department of Chemistry, Imperial College London, London SW7 2AZ, United Kingdom
[3] Institute of Photonics, University of Strathclyde, 106 Rottenrow, Glasgow G4 ONW, United Kingdom - Source
Optics letters. 2008, Vol 33, Num 16, pp 1813-1815, 3 p ; ref : 9 ref
- CODEN
- OPLEDP
- ISSN
- 0146-9592
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Diode électroluminescente Imagerie biomédicale Microscope balayage Microscopie confocale Microscopie fluorescence 0760P 8560J 8757
- Keyword (en)
- Light emitting diodes Biomedical imaging Scanning microscope Confocal microscopy Fluorescence microscopy
- Keyword (es)
- Microscopio barrido Microscopía confocal Microscopía fluorescencia
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60P Conventional optical microscopes
- Pascal
- 002 Biological and medical sciences / 002A Fundamental and applied biological sciences. Psychology / 002A08 Tissues, organs and organisms biophysics / 002A08A General aspects, investigation technics, apparatus
- Discipline
- Biophysics of tissues, organs and organisms Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20641059
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Access to the document
Install on your browser
DOI
10.1364/OL.33.001813 
https://dx.doi.org/10.1364/OL.33.001813
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:20:\"10.1364\/OL.33.001813\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Optics letters\";s:9:\"\u0000*\u0000stitle\";s:9:\"Opt. lett\";s:7:\"\u0000*\u0000date\";s:4:\"2008\";s:9:\"\u0000*\u0000volume\";s:2:\"33\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"1813\";s:8:\"\u0000*\u0000epage\";s:4:\"1815\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0146-9592\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:5:\"POHER\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Vincent\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:8:{i:0;s:17:\"KENNEDY, Gordon T\";i:1;s:15:\"MANNING, Hugh B\";i:2;s:13:\"OWEN, Dylan M\";i:3;s:17:\"ZHANG, Haoxiang X\";i:4;s:8:\"ERDAN GU\";i:5;s:16:\"DAWSON, Martin D\";i:6;s:17:\"FRENCH, Paul M. W\";i:7;s:15:\"NEIL, Mark A. A\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"OPLEDP\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:8:\"\u0000*\u0000place\";s:14:\"Washington, DC\";s:6:\"\u0000*\u0000pub\";s:26:\"Optical Society of America\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:20:\"10.1364\/OL.33.001813\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Optics letters\";s:9:\"\u0000*\u0000stitle\";s:9:\"Opt. lett\";s:7:\"\u0000*\u0000date\";s:4:\"2008\";s:9:\"\u0000*\u0000volume\";s:2:\"33\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"1813\";s:8:\"\u0000*\u0000epage\";s:4:\"1815\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0146-9592\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:5:\"POHER\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Vincent\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:8:{i:0;s:17:\"KENNEDY, Gordon T\";i:1;s:15:\"MANNING, Hugh B\";i:2;s:13:\"OWEN, Dylan M\";i:3;s:17:\"ZHANG, Haoxiang X\";i:4;s:8:\"ERDAN GU\";i:5;s:16:\"DAWSON, Martin D\";i:6;s:17:\"FRENCH, Paul M. W\";i:7;s:15:\"NEIL, Mark A. A\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"OPLEDP\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:8:\"\u0000*\u0000place\";s:14:\"Washington, DC\";s:6:\"\u0000*\u0000pub\";s:26:\"Optical Society of America\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"UnpaywallOpenUrl\":35:{s:8:\"\u0000*\u0000email\";s:27:\"assistance-portail@inist.fr\";s:6:\"\u0000*\u0000fmt\";N;s:6:\"\u0000*\u0000doi\";s:20:\"10.1364\/OL.33.001813\";s:6:\"\u0000*\u0000pii\";N;s:7:\"\u0000*\u0000pmid\";N;s:9:\"\u0000*\u0000atitle\";N;s:9:\"\u0000*\u0000jtitle\";N;s:9:\"\u0000*\u0000stitle\";N;s:7:\"\u0000*\u0000date\";N;s:9:\"\u0000*\u0000volume\";N;s:8:\"\u0000*\u0000issue\";N;s:8:\"\u0000*\u0000spage\";N;s:8:\"\u0000*\u0000epage\";N;s:8:\"\u0000*\u0000pages\";N;s:7:\"\u0000*\u0000issn\";N;s:8:\"\u0000*\u0000eissn\";N;s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";N;s:9:\"\u0000*\u0000aucorp\";N;s:7:\"\u0000*\u0000isbn\";N;s:8:\"\u0000*\u0000coden\";N;s:8:\"\u0000*\u0000genre\";N;s:7:\"\u0000*\u0000part\";N;s:9:\"\u0000*\u0000btitle\";N;s:8:\"\u0000*\u0000title\";N;s:8:\"\u0000*\u0000place\";N;s:6:\"\u0000*\u0000pub\";N;s:10:\"\u0000*\u0000edition\";N;s:9:\"\u0000*\u0000tpages\";N;s:9:\"\u0000*\u0000series\";N;s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";N;}"
Unpaywall access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:20:\"10.1364\/OL.33.001813\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Optics letters\";s:9:\"\u0000*\u0000stitle\";s:9:\"Opt. lett\";s:7:\"\u0000*\u0000date\";s:4:\"2008\";s:9:\"\u0000*\u0000volume\";s:2:\"33\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"1813\";s:8:\"\u0000*\u0000epage\";s:4:\"1815\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0146-9592\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:5:\"POHER\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Vincent\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:8:{i:0;s:17:\"KENNEDY, Gordon T\";i:1;s:15:\"MANNING, Hugh B\";i:2;s:13:\"OWEN, Dylan M\";i:3;s:17:\"ZHANG, Haoxiang X\";i:4;s:8:\"ERDAN GU\";i:5;s:16:\"DAWSON, Martin D\";i:6;s:17:\"FRENCH, Paul M. W\";i:7;s:15:\"NEIL, Mark A. A\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"OPLEDP\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:8:\"\u0000*\u0000place\";s:14:\"Washington, DC\";s:6:\"\u0000*\u0000pub\";s:26:\"Optical Society of America\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:20:\"10.1364\/OL.33.001813\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Optics letters\";s:9:\"\u0000*\u0000stitle\";s:9:\"Opt. lett\";s:7:\"\u0000*\u0000date\";s:4:\"2008\";s:9:\"\u0000*\u0000volume\";s:2:\"33\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"1813\";s:8:\"\u0000*\u0000epage\";s:4:\"1815\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0146-9592\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:5:\"POHER\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Vincent\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:8:{i:0;s:17:\"KENNEDY, Gordon T\";i:1;s:15:\"MANNING, Hugh B\";i:2;s:13:\"OWEN, Dylan M\";i:3;s:17:\"ZHANG, Haoxiang X\";i:4;s:8:\"ERDAN GU\";i:5;s:16:\"DAWSON, Martin D\";i:6;s:17:\"FRENCH, Paul M. W\";i:7;s:15:\"NEIL, Mark A. A\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"OPLEDP\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:8:\"\u0000*\u0000place\";s:14:\"Washington, DC\";s:6:\"\u0000*\u0000pub\";s:26:\"Optical Society of America\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:20:\"10.1364\/OL.33.001813\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:9:\"\u0000*\u0000jtitle\";s:14:\"Optics letters\";s:9:\"\u0000*\u0000stitle\";s:9:\"Opt. lett\";s:7:\"\u0000*\u0000date\";s:4:\"2008\";s:9:\"\u0000*\u0000volume\";s:2:\"33\";s:8:\"\u0000*\u0000issue\";s:2:\"16\";s:8:\"\u0000*\u0000spage\";s:4:\"1813\";s:8:\"\u0000*\u0000epage\";s:4:\"1815\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0146-9592\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:5:\"POHER\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Vincent\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:8:{i:0;s:17:\"KENNEDY, Gordon T\";i:1;s:15:\"MANNING, Hugh B\";i:2;s:13:\"OWEN, Dylan M\";i:3;s:17:\"ZHANG, Haoxiang X\";i:4;s:8:\"ERDAN GU\";i:5;s:16:\"DAWSON, Martin D\";i:6;s:17:\"FRENCH, Paul M. W\";i:7;s:15:\"NEIL, Mark A. A\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"OPLEDP\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:58:\"Improved sectioning in a slit scanning confocal microscope\";s:8:\"\u0000*\u0000place\";s:14:\"Washington, DC\";s:6:\"\u0000*\u0000pub\";s:26:\"Optical Society of America\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:1:\"3\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
arXiv access
