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Integral imaging with increased depth of field and depth of focus by using phase masks

Author
CASTRO, Albertina1 ; FRAUEL, Yann2 ; JAVIDI, Bahram3
[1] Instituto Nacional de Astroffsica, 6ptica y Electrónica, Puebla, Mexico
[2] Departamento de Ciencias de la Computación, Instituto de Investigaciones en Matemáticas Aplicadas y en Sistemas, Universidad Nacional Autónoma de México, Mexico City, Mexico
[3] Department of Electrical and Computer Engineering, University of Connecticut, CT, United States
Conference title
Unmanned/unattended sensors and sensor networks IV (18-20 September 2007, Florence, Italy)
Conference name
Unmanned/unattended sensors and sensor networks (4 ; Florence 2007)
Author (monograph)
Carapezza, Edward M (Editor)
SPIE, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2007 ; 1Vol, pp 673613.1-673613.9 ; ref : 16 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-6894-9
Scientific domain
Electronics; Metrology and instrumentation; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Formation image tridimensionnelle Formation image Image tridimensionnelle Profondeur champ Réglage Tête lecture 0130C 0707D 4230V Masque phase
Keyword (en)
3D imaging Imaging Tridimensional image Depth of field Adjustments Read head Phase mask
Keyword (es)
Formación imagen tridimensional Imagen tridimensional Profundidad campo Cabeza lectura
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings

Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B30 Imaging and optical processing / 001B40B30V Image forming and processing

Discipline
Metrology Physics : optics Theoretical physics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20650110

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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