Characterization of UV irradiated nanocrystalline diamond
- Author
- SPERANZA, G1 ; TORRENGO, S2 ; EL-HAJJ, Hayssam3 ; VITTONE, E2 ; MINATI, L1 ; FILIPPI, M1 ; CASTELLINO, M2 ; MANFREDOTTI, Cl2 ; MANFREDOTTI, Ch2 ; DIPALO, M3 ; PASQUARELLI, A3 ; KOHN, E3
[1] Physics and Chemistry of Surfaces and Interfaces, Fondazione Bruno Kessler, Trento, Italy
[2] Department of Experimental Physics and Nanostructured Interfaces and Surfaces NIS Centre of Excellence, University of Torino, via P.Giuria I, 10125 Torino, Italy
[3] Department of Electron Devices & Circuits, Ulm University (D), Germany - Conference title
- Proceedings of Diamond 2007, the 18th European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, Nitrides and Silicon Carbide
- Conference name
- European Conference on Diamond, Diamond-Like Materials, Carbon Nanotubes, Nitrides and Silicon Carbide (Diamond) (Diamond) (18 ; Berlin 2007-09-09)
- Author (monograph)
- ROBERTSON, John (Editor)1 ; KAWARADA, Hiroshi (Editor); KOHN, Erhard (Editor); HAMERS, Robert (Editor)
[1] Engineering Department, Cambridge University, 9 JJ Thomson Ave, Cambridge CB2 1PZ, United Kingdom - Source
Diamond and related materials. 2008, Vol 17, Num 7-10, pp 1194-1198, 5 p ; ref : 16 ref
- ISSN
- 0925-9635
- Scientific domain
- Crystallography
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Electron affinity Hydrogen termination Nanocrystalline diamond Oxygen termination Surface properties
- Keyword (fr)
- Affinité électronique Bande valence Capteur Conductivité électrique Couche mince Diamant synthétique Effet rayonnement Irradiation UV Mouillabilité Propriété surface Réactivité chimique Résistivité électrique Spectre photoélectron RX Spectre photoélectron UV Structure électronique Température ambiante Traitement surface 6180 6808B 7361 8105U Diamant ultrananocristallin
- Keyword (en)
- Electron affinity Valence bands Sensors Electrical conductivity Thin films Synthetic diamond Radiation effects Ultraviolet irradiation Wettability Surface properties Chemical reactivity Electric resistivity X-ray photoelectron spectra Ultraviolet photoelectron spectra Electronic structure Ambient temperature Surface treatments Ultrananocrystalline diamond
- Keyword (es)
- Diamante sintético Irradiación UV Reactividad química
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A80 Physical radiation effects, radiation damage
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H45 Solid-fluid interfaces / 001B60H45G Wetting
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C61 Electrical properties of specific thin films
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A05 Specific materials / 001B80A05T Fullerenes and related materials; diamonds, graphite
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20664029
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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