Effects of SRO Buffer Layer on Multiferroic BiFeO3 Thin Films
- Autor
- ZHENG, R. Y1 ; SIM, C. H1 ; WANG, J1 ; RAMAKRISHNA, S2
[1] Department of Materials Science and Engineering, Faculty of Engineering, National University of Singapore, Singapore 117574, Singapore
[2] Division of Bioengineering, Faculty of Engineering, National University of Singapore, Singapore 117574, Singapore - Fuente
Journal of the American Ceramic Society. 2008, Vol 91, Num 10, pp 3240-3244, 5 p ; ref : 21 ref
- CODEN
- JACTAW
- ISSN
- 0002-7820
- Campo Científico
- Chemical industry parachemical industry
- Editor
- Blackwell, Malden,MA
- País de la publicación
- United States
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Aimantation Bismuth Fer Oxyde Mixte Bismuth Oxyde Composé minéral Couche mince Couche tampon Cristallisation Croissance cristalline en phase vapeur Diffraction RX Etude expérimentale Fer Oxyde Ferrites Hystérésis Matériau multiferroïque Microscopie électronique balayage Morphologie Oxyde Propriété magnétique Propriété électrique Pulvérisation haute fréquence Ruthénium Strontium Oxyde Mixte Surface BiFeO3 Couche tampon SrRuO3 Substrat Pt/TiO2/SiO2/Si
- Palabra clave (in)
- Magnetization Bismuth Iron Oxides Mixed Bismuth Oxides Inorganic compounds Thin films Buffer layer Crystallization Crystal growth from vapors XRD Experimental study Iron Oxides Ferrites Hysteresis Ferroic material Scanning electron microscopy Morphology Oxides Magnetic properties Electrical properties Radiofrequency sputtering Ruthenium Strontium Oxides Mixed Surfaces
- Palabra clave (es)
- Mixto Capa tampón Material ferroico Pulverización alta frecuencia Mixto
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C61 Electrical properties of specific thin films / 001B70C61L Other inorganic semiconductors
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15C Deposition by sputtering
- Disciplina
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 20759712
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1111/j.1551-2916.2008.02536.x 
https://dx.doi.org/10.1111/j.1551-2916.2008.02536.x
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