Wide temperature range operation of micrometer-scale silicon electro-optic modulators
- Author
- MANIPATRUNI, Sasikanth1 ; DOKANIA, Rajeev K1 ; SCHMIDT, Bradley1 ; SHERWOOD-DROZ, Nicolas1 ; POITRAS, Carl B1 ; APSEL, Alyssa B1 ; LIPSON, Michal1
[1] School of Electrical and Computer Engineering, Cornell University, Ithaca, New York 14853, United States - Source
Optics letters. 2008, Vol 33, Num 19, pp 2185-2187, 3 p ; ref : 15 ref
- CODEN
- OPLEDP
- ISSN
- 0146-9592
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Optical Society of America, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Effet température Modulateur électrooptique Optique intégrée Silicium 4279H 4282G Dispositif optique Spectre transmission
- Keyword (en)
- Temperature effects Electrooptical modulator Integrated optics Silicon Optical devices
- Keyword (es)
- Modulador electro-óptico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B79 Optical elements, devices, and systems / 001B40B79H Optical processors, correlators, and modulators
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02C Optical and optoelectronic circuits / 001D03G02C1 Integrated optics. Optical fibers and wave guides
- Discipline
- Electronics Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20814787
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1364/OL.33.002185 
https://dx.doi.org/10.1364/OL.33.002185
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