Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols
- Author
- BENGTSSON, T1 ; KUMAR, S1 ; UBAR, R.-J2 ; JUTMAN, A2 ; PENG, Z3
[1] Department of Electrical Engineering and Computer Science, School of Engineering, Jönköping University, Sweden
[2] Department of Computer Engineering, Tallinn University of Technology, Estonia
[3] Department of Computer and Information Science, Linköping University, Sweden - Source
IET computers & digital techniques (Print). 2008, Vol 2, Num 6, pp 445-460, 16 p ; ref : 31 ref
- ISSN
- 1751-8601
- Scientific domain
- Electronics; Computer science; Telecommunications
- Publisher
- Institution of Engineering and Technology, Stevenage
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Architecture réseau Autotest Canal bus Circuit intégré Commutateur Diaphonie Détection défaut Globalement asynchrone localement synchrone Interconnexion Méthode essai Niveau transfert registre Pointe de tension Protocole transmission Routeur Réseau interconnexion Signal parasite Système sur puce Temps retard Transmission asynchrone
- Keyword (en)
- Network architecture Built in self test Bus(channel) Integrated circuit Selector switch Crosstalk Defect detection Globally asynchronous locally synchronous Interconnection Test method Register transfer level Voltage spike Transmission protocol Router Interconnection network Spurious signal System on a chip Delay time Asynchronous transmission
- Keyword (es)
- Arquitectura red Autoprueba Canal colector Circuito integrado Conmutador Diafonía Detección imperfección Globalmente asincrono localmente sincrono Interconexión Método ensayo Registro RTL Pico de tensión Protocolo transmisión Router Red interconexión Señal parásito Sistema sobre pastilla Tiempo retardo Transmisión asincrónica
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03D Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A7 Switching, multiplexing, switched capacity circuits
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03J Hardware / 001D03J03 Input-output equipment
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20857461
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1049/iet-cdt:20070048 
https://dx.doi.org/10.1049/iet-cdt:20070048
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