Morphology of femtosecond laser-induced structural changes in MgAl2O4 crystal
- Author
- YU, Ben-Hai1 2 ; DAI, Neng-Li1 ; LI, Yu-Hua1 ; ZHENG, Qi-Guang1 ; LU, Pei-Xiang1
[1] College of Physics & Electronics Engineering, Xinyang Normal University, Xinyang 464000, China
[2] Division of Laser Science &Technology of Wuhan National Laboratory for Optoelectronics, Huazhong University of Science and Technology, Wuhan, 430074, China - Conference title
- Advanced optical manufacturing technologies (3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies)
- Conference name
- International Symposium on Advanced Optical Manufacturing and Testing Technologies (3 ; Chengdu 2007)
- Author (monograph)
- Yang, Li (Editor)
Zhongguo guang xue xue hui, China (Organiser of meeting)
Guo jia zi ran ke xue ji jin wei yuan hui, China (Organiser of meeting)
Zhongguo ke xue yuan, Institute of Optics and Electronics, China (Organiser of meeting)
State Key Laboratory of Optical Technology for Microfabrication, China (Organiser of meeting)
Sichuan Optical Society, China (Organiser of meeting)
Zhongguo guang xue xue hui, Committee of Optical Manufacturing Technology, China (Organiser of meeting)
Society of Photo-optical Instrumentation Engineers, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 6722, pp 672232.1-672232.7 ; 2 ; ref : 24 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-6879-6 0-8194-6879-7
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Addition titane Caméra CCD Céramique transparente Dispositif CCD Domaine temps fs Matériau dopé Microscopie force atomique Microscopie électronique balayage 0130C 0779L Saphir:Ti
- Keyword (en)
- Titanium additions CCD camera Transparent ceramics Charge coupled devices fs range Doped materials Atomic force microscopy Scanning electron microscopy
- Keyword (es)
- Cámara CCD Cerámica transparente
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques / 001B00G79L Atomic force microscopes
- Discipline
- Metrology Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 20917511
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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