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Monte Carlo study of influence of channel length and depth on electron transport in SOI MOSFETs

Author
ZHEVNYAK, Oleg1 ; BORZDOV, Vladimir1 ; BORZDOV, Andrey1 ; POZDNYAKOV, Dmitry1 ; KOMAROV, Fadei1
[1] Belarus State University, Nezavisimosty av. 4, Minsk, 220030, Belgium
Conference title
Micro- and nanoelectronics 2007 (1-5 October 2007, Zvenigorod, Russia)
Conference name
ICMNE-2007 (Zvenigorod 2007)
Author (monograph)
Valiev, Kamil Akhmetovich (Editor); Orlikovskii, Aleksandr Aleksandrovich (Editor)
Fiziko-tekhnologicheskii institut, Rossiiskaia akademiia nauk, Russian Federation (Organiser of meeting)
Society of Photo-optical Instrumentation Engineers, Russian Chapter, Russian Federation (Organiser of meeting)
Rossiiskii fond fundamentalnykh issledovanii, Russian Federation (Organiser of meeting)
Society of photo-optical instrumentation engineers, United States (Organiser of meeting)
Source

Proceedings of SPIE, the International Society for Optical Engineering. 2008, Vol 7025, pp 70251L.1-70251L.8 ; ref : 36 ref

CODEN
PSISDG
ISSN
0277-786X
ISBN
978-0-8194-7238-0 0-8194-7238-7
Scientific domain
Electronics; Metrology and instrumentation; Nanotechnologies, nanostructures, nanoobjects; Optics; Physics
Publisher
SPIE, Bellingham, Wash
Publication country
United States
Document type
Conference Paper
Language
Russian
Keyword (fr)
Condition aux limites Couche appauvrissement Equation Poisson Méthode Monte Carlo Simulation numérique Technologie silicium sur isolant Transistor MOSFET Vitesse dérive
Keyword (en)
Boundary condition Depletion layer Poisson equation Monte Carlo method Numerical simulation Silicon on insulator technology MOSFET Drift velocity
Keyword (es)
Condiciones límites Capa empobrecimiento Ecuación Poisson Método Monte Carlo Simulación numérica Tecnología silicio sobre aislante Velocidad deriva
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
20921951

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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