Stress of needle specimen on the three-dimensional atom probe (3DAP)

Autor

MAYAMA, N¹ ; YAMASHITA, C¹ ; KAITO, T² ; NOJIMA, M³ ; OWARI, M^{1 4}
[1] Institute of Industrial Science, The University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8505, Japan
[2] Sll Nanotechnology Inc., 36-1 Takenoshita, Oyama-cho, Sunto-gun, Shizuoka 410-1393, Japan
[3] Research Institute of Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan
[4] Environmental Science Center, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-0033, Japan

Titulo de la conferencia

International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 2007), Kanazawa, Japan, 28 October-2 November 2007

Nombre de la conferencia

International Symposium on Atomic Level Characterizations for New Materials and Devices (ALC 2007) (ALC 2007) (6 ; Kanazawa 2007-10-28)

Autor ( monografía)

KAWAI, J (Editor); TANAKA, K (Editor); TAKAKUWA, Y (Editor); TSUYUMOTO, I (Editor); ASAKURA, K (Editor); ETOH, T. G (Editor); FUJII, Y (Editor); HATA, K (Editor); IKUTA, T (Editor); KIDO, Y (Editor); SAITO, Y (Editor); SHIMIZU, R (Editor)
Japan Society for the Promotion of Science (JSPS), Japan (Organiser of meeting)

Fuente

Surface and interface analysis. 2008, Vol 40, Num 13, pp 1610-1613, 4 p ; ref : 7 ref

CODEN

SIANDQ

ISSN

0142-2421

Campo Científico

General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics

Editor

Wiley, Chichester

País de la publicación

United Kingdom

Tipo de documento

Conference Paper

Idioma

English

Palabra clave de autor

3DAP electric stress local electrode simulation

Palabra clave (fr)

Contrainte électrique Distribution contrainte Evaporation champ Rupture Simulation Sonde atomique Système 3 dimensions

Palabra clave (in)

Electric stress Stress distribution Field evaporation Ruptures Simulation Atom probe Three-dimensional systems

Palabra clave (es)

Tensión eléctrica Sonda atómica

Clasificación

Pascal

001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy

Disciplina

Physics of condensed state : structure, mechanical and thermal properties

Procedencia

Inist-CNRS

Base de datos

PASCAL

Identificador INIST

21018692

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