Class-C Harmonic CMOS VCOs, With a General Result on Phase Noise
- Author
- MAZZANTI, Andrea1 ; ANDREANI, Pietro2
[1] Università di Modena e Reggio Emilia, Dipartimento di Ingegneria dell'Informazione, 41100 Modena, Italy
[2] Department of Electrical and Information Technology, Lund University, 221 00 Lund, Sweden - Conference title
- Special Issue on the 2008 IEEE International Solid-State Circuits Conference (ISSCC)
- Conference name
- IEEE International Solid-State Circuits Conference (ISSCC) (ISSCC) (San Francisco, CA 2008-02)
- Author (monograph)
- TSUKAMOTO, Sanroku (Editor)1 ; LIU, Shen-Iuan (Editor)2 ; HEINEN, Stefan (Editor)3 ; THEWES, Roland (Editor)4 ; JRI LEE (Editor)2
[1] Fujitsu Laboratories Ltd., Kawasaki, 211-8588, Japan
[2] National Taiwan Unviersity, Taipei, 10617, Taiwan, Province of China
[3] RWTH Aachen University, Aachen, 52074, Germany
[4] Qimonda AG, Neubiberg, 85579, Germany - Source
IEEE journal of solid-state circuits. 2008, Vol 43, Num 12, pp 2716-2729, 14 p ; ref : 52 ref
- CODEN
- IJSCBC
- ISSN
- 0018-9200
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Amplitude stability class-C impulse sensitivity function phase noise radio frequency integrated circuits squegging voltage controlled oscillators
- Keyword (fr)
- Amplificateur différentiel Analyse circuit Analyse temporelle Bande fréquence Bruit phase Capacité électrique Circuit accordable Circuit intégré CMOS Circuit intégré radiofréquence Circuit intégré Consommation énergie électrique Etat actuel Evaluation performance Facteur mérite Harmonique Oscillateur commande tension Oscillateur harmonique Prototype Radiofréquence Technologie MOS complémentaire Transistor
- Keyword (en)
- Differential amplifier Network analysis Time analysis Frequency band Phase noise Capacitance Tunable circuit CMOS integrated circuits Radiofrequency integrated circuits Integrated circuit Power consumption State of the art Performance evaluation Figure of merit Harmonic Voltage controlled oscillator Harmonic oscillator Prototype Radiofrequency Complementary MOS technology Transistor
- Keyword (es)
- Amplificador diferencial Análisis circuito Análisis temporal Banda frecuencia Ruido fase Capacitancia Circuito acordable Circuito integrado Estado actual Evaluación prestación Factor mérito Armónica Oscilador comando tensión Oscilador armónico Prototipo Radiofrecuencia Tecnología MOS complementario Transistor
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A1 Oscillators, resonators, synthetizers
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02A Electronic circuits / 001D03G02A2 Amplifiers
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21033842
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/JSSC.2008.2004867 
https://dx.doi.org/10.1109/JSSC.2008.2004867
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