Application of XPS and ToF-SIMS for surface chemical analysis of DNA microarrays and their substrates
- Author
- GRAF, Nora1 ; GROSS, Thomas1 ; WIRTH, Thomas1 ; WEIGEL, Wilfried2 ; UNGER, Wolfgang E. S1
[1] Federal Institute for Materials Research and Testing (BAM), Unter den Eichen 44-46, 12203 Berlin, Germany
[2] Scienion AG, 12489 Berlin, Germany - Conference name
- Conference of Applied Surface Analysis-AOFA 15 (15 ; Soest 2008-09-08)
- Source
Analytical & bioanalytical chemistry (Print). 2009, Vol 393, Num 8, pp 1907-1912, 6 p ; ref : 24 ref
- ISSN
- 1618-2642
- Scientific domain
- Food science technology; Analytical chemistry; Chemistry
- Publisher
- Springer, Heidelberg
- Publication country
- Germany
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Chemical imaging Microarrays Surface analysis ToF-SIMS XPS
- Keyword (fr)
- Analyse chimique Analyse surface Capteur chimique Composition chimique DNA Formation image Haute résolution Microanalyse Méthode temps vol Rayon X Réseau capteur Spectrométrie RX Spectrométrie SIMS Spectrométrie photoélectron
- Keyword (en)
- Chemical analysis Surface analysis Chemical sensor Chemical composition DNA Imaging High resolution Microanalysis Time of flight method X ray Sensor array X ray spectrometry Secondary ion mass spectrometry Photoelectron spectrometry
- Keyword (es)
- Análisis químico Análisis superficie Captador químico Composición química DNA Formación imagen Alta resolucion Microanálisis Método tiempo vuelo Rayos X Red sensores Espectrometría RX Espectrometría SIMS Espectrometría fotoelectrón
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04A General, instrumentation
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods
- Discipline
- Analytical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21336654
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s00216-009-2599-x 
https://dx.doi.org/10.1007/s00216-009-2599-x
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