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Numerical simulation of the effect of recombination centres and traps created by electron irradiation on the performance degradation of GaAs solar cells

Author
MEFTAH, A. F1 ; SENGOUGA, N1 ; BELGHACHI, A2 ; MEFTAH, A. M1
[1] Laboratory of Metallic and Semiconducting Materials, Faculty of Science and Engineering, Mohamed Kheider University, BP 145, 07000 Biskra, Algeria
[2] Laboratory of Semiconductor Devices Physics, Physics Department, University of Béchar, PO Box 417, Béchar 08000, Algeria
Source

Journal of physics. Condensed matter (Print). 2009, Vol 21, Num 21 ; 215802.1-215802.7 ; ref : 19 ref

CODEN
JCOMEL
ISSN
0953-8984
Scientific domain
Crystallography; Metallurgy, welding; Condensed state physics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Arséniure de gallium Cellule solaire Courant court circuit Dégradation Effet rayonnement Etat défaut Faisceau électronique Niveau profond Piégeage porteur charge Recombinaison porteur charge Semiconducteur Simulation numérique GaAs
Keyword (en)
Gallium arsenides Solar cell Short circuit currents Degradation Radiation effect Defect states Electron beam Deep level Charge carrier trapping Charge carrier recombination Semiconductor materials Numerical simulation
Keyword (es)
Célula solar Degradación Efecto radiación Haz electrónico Nivel profundo Captura portador carga Recombinación portador carga Semiconductor(material) Simulación numérica
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D06 Energy / 001D06C Natural energy / 001D06C02 Solar energy / 001D06C02D Photovoltaic conversion / 001D06C02D1 Solar cells. Photoelectrochemical cells

Discipline
Energy
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
21516965

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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