Morphological Change in Tip Based Nano-Patterned Planar InAs
- Author
- EYINK, K. G1 ; GRAZULIS, L2 ; MAHALINGAM, K3 ; SHOAF, J. R1
[1] Air Force Research Laboratory, Materials & Manufacturing Directorate, Wright-Patterson AFB, OH, 45433-7707
[2] University of Dayton Research Institute, 300 College Park, Dayton, OH 45469-0178, United States
[3] Universal Technology Corporation, Dayton, OH, 45432-2600, United States - Conference title
- Quantum dots, particles, and nanoclusters VI (25-28 January 2009, San Jose, California, United States)
- Conference name
- Quantum dots, particles, and nanoclusters (6 ; San Jose CA 2009)
- Author (monograph)
- Eyink, Kurt Gerard (Editor); Szmulowicz, Frank (Editor); Huffaker, Diana Lynne (Editor)
SPIE, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7224 ; 1Vol ; 722408.1-722408.6 ; ref : 12 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-7470-4 0-8194-7470-3
- Scientific domain
- Electronics; Nanotechnologies, nanostructures, nanoobjects; Optics; Condensed state physics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Arséniure d'indium Changement morphologique Composé binaire Composé minéral Couche épaisse Formation motif Indium Arséniure Microscopie force atomique Microscopie tunnel balayage Nanomatériau Oxyde Point quantique Positionnement Recuit Semiconducteur Tension superficielle 0130C 0779L 8107 As In InAs
- Keyword (en)
- Indium arsenides Morphological changes Binary compounds Inorganic compounds Thick films Patterning Indium Arsenides Atomic force microscopy Scanning tunneling microscopy Nanostructured materials Oxides Quantum dots Positioning Annealing Semiconductor materials Surface tension
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00A Communication, education, history, and philosophy / 001B00A30 Physics literature and publications / 001B00A30C Conference proceedings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques / 001B00G79L Atomic force microscopes
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A07 Nanoscale materials and structures: fabrication and characterization / 001B80A07Z Other topics in nanoscale materials and structures
- Discipline
- Metrology Physics and materials science Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21680666
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.810160 
https://dx.doi.org/10.1117/12.810160
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