The conception of new, simple low-voltage cathodoluminescence set-up with CNT field emission cathodes
- Author
- PSUJA, Piotr1 ; HRENIAK, Dariusz1 ; STREK, Wieslaw1
[1] Institute of Low Temperature and Structure Research of PAS ul. Okolna 2, 50-422 Wroclaw, Poland - Conference title
- Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices VIII (28-29 January 2009, San Jose, California, United States)
- Conference name
- Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices (8 ; San Jose CA)
- Author (monograph)
- Kullberg, Richard C (Editor); Ramesham, Rajeshuni (Editor)
SPIE, United States (Organiser of meeting)
Texas Instruments, United States (Organiser of meeting) - Source
Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7206 ; 1Vol ; 72060F.1-72060F.6 ; ref : 26 ref
- CODEN
- PSISDG
- ISSN
- 0277-786X
- ISBN
- 978-0-8194-7452-0 0-8194-7452-5
- Scientific domain
- Electronics; Optics; Physics
- Publisher
- SPIE, Bellingham, Wash
- Publication country
- United States
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Anode Basse tension Capteur pression Cathode froide Cathode émission champ Cathodoluminescence Chambre à vide Dispositif luminescent Dispositif nanotube Emission champ Matériau luminescent Nanotube carbone Revêtement Spectrophotomètre 0130C 0707D
- Keyword (en)
- Anode Low voltage Pressure sensor Cold cathode Field emitter Cathodoluminescence Vacuum chamber Light emitting device Nanotube devices Field emission Luminescent material Carbon nanotubes Coatings Spectrophotometer
- Keyword (es)
- Anodo Baja tensión Captador presión Cátodo frío Cátodo emisión campo Catodoluminiscencia Cámara de vacío Dispositivo luminiscente Emisión campo Material luminescente Revestimiento Espectrofotómetro
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F15 Optoelectronic devices
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F18 Molecular electronics, nanoelectronics
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F19 Vacuum microelectronics
- Discipline
- Electronics Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21681134
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1117/12.808963 
https://dx.doi.org/10.1117/12.808963
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