Influence of film thickness on the structural, electrical and photoluminescence properties of vacuum deposited Alq3 thin films on c-silicon substrate
- Author
- KOAY, J. Y1 ; SHARIF, Khairul Anuar M1 ; RAHMAN, Saadah A1
[1] Solid State Research Laboratory, Department of Physics, Faculty of Science, University of Malaya, 50603 Kuala Lumpur, Malaysia - Conference title
- 4th International Conference on Technological Advances of Thin Films and Surface Coatings
- Conference name
- International Conference on Technological Advances of Thin Films and Surface Coatings (4 ; Singapore 2008-07)
- Author (monograph)
- ZHANG, Sam (Editor)1 ; CHEE WONG (Editor); GOH, Gregory (Editor); GUOJUN QI (Editor); ZHONG CHEN (Editor); LIU, Erjia (Editor)
[1] School of Mechanical and Aerospace Engineering, Nanyang Technological University, 50 Nanyang Avenue, Singapore 639798, Singapore - Source
Thin solid films. 2009, Vol 517, Num 17, pp 5298-5300, 3 p ; ref : 12 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Author keyword
- Capacitance-voltage Current-voltage Photoluminescence Transition voltage
- Keyword (fr)
- Aluminium Caractéristique capacité tension Caractéristique courant tension Composé de l'aluminium Couche mince Dépôt sous vide Dérivé de la quinoléine Epaisseur couche Evaporation sous vide Photoluminescence Propriété électrique Spectrométrie transformée Fourier Technique vide 6855J 7350 7855 8115E Substrat silicium
- Keyword (en)
- Aluminium CV characteristic IV characteristic Aluminium compounds Thin films Vacuum deposition Quinoline derivatives Layer thickness Vacuum evaporation Photoluminescence Electrical properties Fourier transform spectroscopy Vacuum techniques
- Keyword (es)
- Quinolina derivado Espesor capa
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C50 Electronic transport phenomena in thin films and low-dimensional structures
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H55 Photoluminescence
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15E Vacuum deposition
- Discipline
- Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21714338
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2009.03.145 
https://dx.doi.org/10.1016/j.tsf.2009.03.145
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