Spectrométrie d'émission optique à source étincelle (partie 1)
- Other title
- Spark-source optical emission spectrometry (part 1) (en)
- Author
- MEILLAND, Raymond1
[1] Arcelor Research, France - Source
Techniques de l'ingénieur. Analyse et caractérisation. 2005, Vol TA4, Num P2755 ; P2755.1-P2755.15
- ISSN
- 1762-8717
- Scientific domain
- Analytical chemistry
- Publisher
- Techniques de l'ingénieur, Paris
- Publication country
- France
- Document type
- Article
- Language
- French
- Keyword (fr)
- Analyse chimique Arc électrique Article synthèse Décharge étincelle Monochromateur Photomultiplicateur Spectre émission optique Spectrométrie émission Polychromateur
- Keyword (en)
- Chemical analysis Electric arc Review Spark discharge Monochromator Photomultiplier Optical emission spectra Emission spectrometry
- Keyword (es)
- Análisis químico Arco eléctrico Artículo síntesis Descarga chispa Monocromador Fotomultiplicador Espectro emisión óptica Espectrometría emisión
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods
- Discipline
- Analytical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21778554
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:9:\"\u0000*\u0000jtitle\";s:55:\"Techniques de l'ing\u00e9nieur. Analyse et caract\u00e9risation\";s:9:\"\u0000*\u0000stitle\";s:27:\"Tech. ing., Anal. caract\u00e9r\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:3:\"TA4\";s:8:\"\u0000*\u0000issue\";s:5:\"P2755\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:16:\"P2755.1-P2755.15\";s:7:\"\u0000*\u0000issn\";s:9:\"1762-8717\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"MEILLAND\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Raymond\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:26:\"Techniques de l'ing\u00e9nieur\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:9:\"\u0000*\u0000jtitle\";s:55:\"Techniques de l'ing\u00e9nieur. Analyse et caract\u00e9risation\";s:9:\"\u0000*\u0000stitle\";s:27:\"Tech. ing., Anal. caract\u00e9r\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:3:\"TA4\";s:8:\"\u0000*\u0000issue\";s:5:\"P2755\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:16:\"P2755.1-P2755.15\";s:7:\"\u0000*\u0000issn\";s:9:\"1762-8717\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"MEILLAND\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Raymond\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:26:\"Techniques de l'ing\u00e9nieur\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:9:\"\u0000*\u0000jtitle\";s:55:\"Techniques de l'ing\u00e9nieur. Analyse et caract\u00e9risation\";s:9:\"\u0000*\u0000stitle\";s:27:\"Tech. ing., Anal. caract\u00e9r\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:3:\"TA4\";s:8:\"\u0000*\u0000issue\";s:5:\"P2755\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:16:\"P2755.1-P2755.15\";s:7:\"\u0000*\u0000issn\";s:9:\"1762-8717\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"MEILLAND\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Raymond\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:26:\"Techniques de l'ing\u00e9nieur\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:9:\"\u0000*\u0000jtitle\";s:55:\"Techniques de l'ing\u00e9nieur. Analyse et caract\u00e9risation\";s:9:\"\u0000*\u0000stitle\";s:27:\"Tech. ing., Anal. caract\u00e9r\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:3:\"TA4\";s:8:\"\u0000*\u0000issue\";s:5:\"P2755\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:16:\"P2755.1-P2755.15\";s:7:\"\u0000*\u0000issn\";s:9:\"1762-8717\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"MEILLAND\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Raymond\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:26:\"Techniques de l'ing\u00e9nieur\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:9:\"\u0000*\u0000jtitle\";s:55:\"Techniques de l'ing\u00e9nieur. Analyse et caract\u00e9risation\";s:9:\"\u0000*\u0000stitle\";s:27:\"Tech. ing., Anal. caract\u00e9r\";s:7:\"\u0000*\u0000date\";s:4:\"2005\";s:9:\"\u0000*\u0000volume\";s:3:\"TA4\";s:8:\"\u0000*\u0000issue\";s:5:\"P2755\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:16:\"P2755.1-P2755.15\";s:7:\"\u0000*\u0000issn\";s:9:\"1762-8717\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:8:\"MEILLAND\";s:10:\"\u0000*\u0000aufirst\";s:7:\"Raymond\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:66:\"Spectrom\u00e9trie d'\u00e9mission optique \u00e0 source \u00e9tincelle (partie 1)\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:26:\"Techniques de l'ing\u00e9nieur\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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