Coherence Cloning Using Semiconductor Laser Optical Phase-Lock Loops
- Author
- SATYAN, Naresh1 ; WEI LIANG2 ; YARIV, Amnon3
[1] Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125, United States
[2] OEwaves, Inc., Pasadena, CA 91106, United States
[3] Department of Applied Physics and the Department of Electrical Engineering, California Institute of Technology, Pasadena, CA 91125, United States - Source
IEEE journal of quantum electronics. 2009, Vol 45, Num 7-8, pp 755-761, 7 p ; ref : 12 ref
- CODEN
- IEJQA7
- ISSN
- 0018-9197
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Author keyword
- Optical interferometry optical phase-lock loops (OPLLs) phase noise semiconductor lasers (SCLs)
- Keyword (fr)
- Boucle verrouillage phase Bruit phase Interférométrie optique Laser fibre Laser réaction répartie Laser semiconducteur Modulation fréquence Réponse fréquence Verrouillage phase 0760L 4255P 4255W
- Keyword (en)
- Phase locked loops Phase noise Light interferometry Fiber lasers Distributed feedback lasers Semiconductor lasers Frequency modulation Frequency response Phase locking
- Keyword (es)
- Enganche de fase
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G60 Optical instruments, equipment and techniques / 001B00G60L Interferometers
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B55 Lasers / 001B40B55P Semiconductor lasers; laser diodes
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B55 Lasers / 001B40B55W Fiber lasers
- Discipline
- Metrology Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 21803976
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/JQE.2009.2013120 
https://dx.doi.org/10.1109/JQE.2009.2013120
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